Albumin adsorption on polycarbonate : correlation between XPS and TOF-SIMS analyses

Rouxhet, Laurence;Bertrand, Patrick
(2000) 12th International Conference on Secondary Ion Mass Spectrometry and Related Topics, SIMS XII — Location: Brussels, Belgium (5.September.1999)

Files

No attached file found for this publication.

Details

Authors
  • Rouxhet, LaurenceUCLouvain
    Author
  • Bertrand, PatrickUCLouvain
    Author
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Rouxhet, L., & Bertrand, P. (2000). Albumin adsorption on polycarbonate : correlation between XPS and TOF-SIMS analyses. In A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner (ed.), Secondary Ion Mass Spectrometry, SIMS XII (p. p. 907-910). Elsevier Science Publ. https://hdl.handle.net/2078.5/149559