Investigation of Dealuminated Mordenites By X-ray Photoelectron-spectroscopy

Remy, MJ.;Genet, MJ.;Poncelet, Georges;Lardinois, PF.;Notte, PP.
(1992) Journal of Physical Chemistry — Vol. 96, n° 6, p. 2614-2617 (1992)

Files

No attached file found for this publication.

Details

Authors
  • Remy, MJ.
    Author
  • Genet, MJ.
    Author
  • Poncelet, GeorgesUCLouvain
    Author
  • Lardinois, PF.
    Author
  • Notte, PP.
    Author
Abstract
Mg K-alpha X-ray photoelectron spectroscopy (XPS) was used to establish the relative concentration and the chemical state of aluminum at the surface of dealuminated mordenites. A method for the binding energy calibration is proposed. Modified Auger parameters of Al have been determined for different zeolites and clay minerals as well as for dealuminated mordenites. The data are compared with those available in the literature. Ranges of values for modified Auger parameter of octahedral and tetrahedral aluminum are reported. The results obtained on highly dealuminated mordenites are consistent with the presence of surface tricoordinated Al.
Affiliations

Citations

Remy, MJ., Genet, MJ., Poncelet, G., Lardinois, PF., & Notte, PP. (1992). Investigation of Dealuminated Mordenites By X-ray Photoelectron-spectroscopy. Journal of Physical Chemistry, 96(6), 2614-2617. https://doi.org/10.1021/j100185a041 (Original work published 1992)