Xps Determination of the Thickness of Adsorbed Mouthrinse Components On Dental Enamel

Busscher, HJ.;Vandermei, HC.;Genet, MJ.;Perdok, JF.;Rouxhet, Paul
(1990) Surface and Interface Analysis — Vol. 15, n° 5, p. 344-346 (1990)

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  • Busscher, HJ.
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  • Vandermei, HC.
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  • Genet, MJ.
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  • Perdok, JF.
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  • Rouxhet, PaulUCLouvain
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Busscher, HJ., Vandermei, HC., Genet, MJ., Perdok, JF., & Rouxhet, P. (1990). Xps Determination of the Thickness of Adsorbed Mouthrinse Components On Dental Enamel. Surface and Interface Analysis, 15(5), 344-346. https://doi.org/10.1002/sia.740150508 (Original work published 1990)