Characterization of SOI MOSFETs at microwave frequencies
(1997) 48th Electrochemical Society Meeting - SOI symposium — Location: Paris, France
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Gillon, R., Raskin, J.-P., Vanhoenacker-Janvier, D., Colinge, J.-P., & Dambrine, G. (1997). Characterization of SOI MOSFETs at microwave frequencies. Proceedings of the 48th Electrochemical Society Meeting - SOI symposium, pp. 149-154. https://hdl.handle.net/2078.5/229297