On-wafer wideband characterization of advanced MOS devices

Lederer, Dimitri;Chung, Tsung Ming;Pailloncy, G.;Raskin, Jean-Pierre
(2006) Union Radio-Scientifique Internationale (U.R.S.I.) Benelux Meeting — Location: Eindhoven, The Netherlands (12.May.2006)

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Lederer, D., Chung, T. M., Pailloncy, G., & Raskin, J.-P. (2006). On-wafer wideband characterization of advanced MOS devices. Proceedings of the Union Radio-Scientifique Internationale (U.R.S.I.) Benelux Meeting, p. 17. https://hdl.handle.net/2078.5/231931