On the mechanism of creep-controlled electromigration-induced drift

Proost, Joris;Jin, M.;D'Haen, J.
(2005) the Minerals, Metals and Materials Society (TMS) Symposium on Mechanical Behaviour of Thin Films and Small Structures — Location: San Francisco

Files

No attached file found for this publication.

Details

Authors
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Proost, J., Jin, M., & D’Haen, J. (2005). On the mechanism of creep-controlled electromigration-induced drift. Proceedings, p. 97. https://hdl.handle.net/2078.5/230570