In-situ diagnostics for monitoring the processing and properties of anodised metallic oxide thin films
(2006) Electroceramics X — Location: Toledo (2006)
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Vanhumbeeck, J.-F., & Proost, J. (2006). In-situ diagnostics for monitoring the processing and properties of anodised metallic oxide thin films. Electroceramics X, p. Abstract TTF-O-01. https://hdl.handle.net/2078.5/222195