Sub-threshold RF characteristics of Partially-Depleted SOI MOSFETs
(2011) 2011 IEEE Subthreshold Microelectronics Conference — Location: Lexington, MA, USA (26.September.2011)
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Emam, M., & Raskin, J.-P. (2011). Sub-threshold RF characteristics of Partially-Depleted SOI MOSFETs. Proceedings of the 2011 IEEE Subthreshold Microelectronics Conference, p. Session 2 RF and Analog Circuits, paper # 3. https://hdl.handle.net/2078.5/230584