Laser ablation and static secondary ion mass spectrometry capabilities in the characterization of inorganic materials
(2002) Applied Surface Science — Vol. 186, n° 1-4, p. 315-321 (2002)
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- Abstract
- Recently, mass spectrometry techniques such as laser ablation and static secondary ion mass spectrometry (LA-MS and s-SIMS, respectively) have been successfully applied to the characterization of inorganic compounds in solid state phase: s-SIMS is known as a surface analytical technique whereas LA-MS involves atoms in a greater thickness (bulk). In the case of s-SIMS, the direct ejection of ions from the surface upon primary ion sputtering for ion fluence down to 10(13) ions/cm(2), leads to a simple and direct diagnostic by comparing the spectra to databases. On the opposite, characterization of inorganic compounds by means of LA-MS is not immediate due to the most detected ions are issued from complex gas phase reactions. This feature can be successfully applied to investigate matter transfer processes occurring during pulsed-laser deposition (PLD) experiments. By the mean of a systematic and comparative study of LA-MS and s-SlMS spectra for binary (Cu-O) or ternary (Fe-Cr-O) oxide systems, we demonstrate that both techniques are complementary to each other in the field of material science. (C) 2002 Elsevier Science B.V. All rights reserved.
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Aubriet, F., Poleunis, C., Chaoui, N., Maunit, B., Millon, E., Muller, J., & Bertrand, P. (2002). Laser ablation and static secondary ion mass spectrometry capabilities in the characterization of inorganic materials. Applied Surface Science, 186(1-4), 315-321. https://hdl.handle.net/2078.5/64505 (Original work published 2002)