Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ-SiO2 gate stacks

et al., Nguyen, V.-H., & et al. (2015). Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ-SiO2 gate stacks. Applied Physics Letters, 106(2), 23508. https://doi.org/10.1063/1.4906199 (Original work published 2015)