Combined XPS and ToF-SIMS study of miscible polymer blend surfaces: Polystyrene/poly(2,6-dimethyl-1,4-phenyl oxide) (PS/PDMPO)
(1999) Surface and Interface Analysis — Vol. 27, n° 3, p. 157-164 (1999)
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- Abstract
- The influence of polystyrene concentration in polystyrene and poly(2,6-dimethyl-1,4-phenylene oxide) (PS/PDMPO) miscible polymer blends has been studied by the combined techniques of x-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). The O 1s/C 1s ratio in SPS and the peak intensities of characteristic fragments in ToF-SIMS are found to be linearly dependent on bulk concentrations. Angle-resolved x-ray photoelectron spectroscopy measurement does not show any concentration profile from the surface to the bulk. Both techniques confirm that the polymer surface concentrations are directly related to the bulk concentrations. Possible explanations for this absence of segregation are discussed. Copy-right (C) 1999 John Wiley & Sons, Ltd.
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Vanden Eynde, X., & Bertrand, P. (1999). Combined XPS and ToF-SIMS study of miscible polymer blend surfaces: Polystyrene/poly(2,6-dimethyl-1,4-phenyl oxide) (PS/PDMPO). Surface and Interface Analysis, 27(3), 157-164. https://doi.org/10.1002/(SICI)1096-9918(199903)27:3<157::AID-SIA495>3.0.CO;2-L (Original work published 1999)