Combining TOF-SIMS with XPS and AFM to quantify organic surface coverages
(2000) 12th International Conference on Secondary Ion Mass Spectrometry and Related Topics, SIMS XII — Location: Brussels, Belgium (5.September.1999)
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Kenens, C., conard, T., Hellemans, L., Bertrand, P., & Vandervorst, W. (2000). Combining TOF-SIMS with XPS and AFM to quantify organic surface coverages. In A. Benninghoven, P. Bertrand, H.-N. Migeon and H. Werner (ed.), Secondary Ion Mass Spectrometry, SIMS XII (p. p. 821-824). Elsevier Science Publ. ,. https://hdl.handle.net/2078.5/221309