Effect of Internal Stress on the Chemical Texturing of Sputtered Al:ZnO Layers for Light-Trapping in Thin Film Solar Cells

Michotte, Sébastien;Van Overmeere, Quentin;van Caloen, Emmanuel;Sbille, Isabelle;Proost, Joris;et.al.
(2011) 220th Meeting of the Electrochemical Society and the Electrochemical Energy Summit, Symposium Photovoltaics for the 21st Century — Location: Boston, USA (9.October.2011)

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  • Michotte, SébastienUCLouvain
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  • Van Overmeere, QuentinUCLouvain
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  • van Caloen, EmmanuelUCLouvain
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  • Sbille, IsabelleUCLouvain
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  • Santoro, RonnyUCLouvain
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  • Proost, JorisUCLouvain
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Michotte, S., Van Overmeere, Q., van Caloen, E., Sbille, I., Santoro, R., & Proost, J. (2011). Effect of Internal Stress on the Chemical Texturing of Sputtered Al:ZnO Layers for Light-Trapping in Thin Film Solar Cells. Proceedings of 220th Meeting of the Electrochemical Society and the Electrochemical Energy Summit, p. Abstract #2007. https://hdl.handle.net/2078.5/225855