Small and large-signal wideband characterization of RF SOI technology
(2017) The 30th International Conference on Microelectronic Test Structures – ICMTS 2017 — Location: Grenoble, France (28.March.2017)
Files
No attached file found for this publication.
Details
- Authors
- Affiliations
Citations
Raskin, J.-P. (2017). Small and large-signal wideband characterization of RF SOI technology. Proceedings of The 30th International Conference on Microelectronic Test Structures – ICMTS 2017, p. invited paper#1. https://hdl.handle.net/2078.5/226602