Application of high-resolution curvature measurements to the investigation of charging effects at metal oxide/electrolyte interfacesVanhumbeeck, Jean-François;Proost, Joris(2007) 11th International Conference on Electrified Interfaces — Location: Sahoro, Japan (2007)
FilesNo attached file found for this publication.DetailsAuthorsVanhumbeeck, Jean-FrançoisUCLouvainAuthorProost, JorisUCLouvainAuthorAffiliationsUCLouvainFSA/MAPR - Département des sciences des matériaux et des procédésShow moreCitations APA Chicago FWB Vanhumbeeck, J.-F., & Proost, J. (2007). Application of high-resolution curvature measurements to the investigation of charging effects at metal oxide/electrolyte interfaces. Proceedings, p. 25-19. https://hdl.handle.net/2078.5/228968