Application of high-resolution curvature measurements to the investigation of charging effects at metal oxide/electrolyte interfaces

Vanhumbeeck, Jean-François;Proost, Joris
(2007) 11th International Conference on Electrified Interfaces — Location: Sahoro, Japan (2007)

Files

No attached file found for this publication.

Details

Authors
  • Vanhumbeeck, Jean-FrançoisUCLouvain
    Author
  • Proost, JorisUCLouvain
    Author
Affiliations

Citations

Vanhumbeeck, J.-F., & Proost, J. (2007). Application of high-resolution curvature measurements to the investigation of charging effects at metal oxide/electrolyte interfaces. Proceedings, p. 25-19. https://hdl.handle.net/2078.5/228968