RF SOI, from material to devicesRaskin, Jean-Pierre(2017) Short Course SMC, IEEE International Microwave Symposium – IMS’17 — Location: Honolulu, Hawaii (USA) (4.June.2017)
FilesIMS2017_SMC_JPRaskin1.pdf Open Access Adobe PDF4.18 MBDownloadDetailsAuthorsRaskin, Jean-PierreUCLouvainAuthorAffiliationsUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueShow moreCitations APA Chicago FWB Raskin, J.-P. (2017). RF SOI, from material to devices. Short Course SMC, IEEE International Microwave Symposium – IMS’17, Honolulu, Hawaii (USA). https://hdl.handle.net/2078.5/228080