High frequency dielectric properties measurements of polymeric films using time-domain terahertz spectroscopy

Allard, Jean-François;Savard, S.;Spiegel, Judith;Huynen, Isabelle;Morris, D.;et.al.
(2007) 13th Canadian Semiconductor Technology Conference — Location: Montréal, Canada (14.August.2007)

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  • Allard, Jean-François
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  • Savard, S.
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  • Spiegel, JudithUCLouvain
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  • Morris, D.
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Allard, J.-F., Savard, S., Spiegel, J., Huynen, I., Salissou, Y., Salem, B., Béchamp-Laganière, X., Aimez, V., Charlebois, S. A., Houde, D., & Morris, D. (2007). High frequency dielectric properties measurements of polymeric films using time-domain terahertz spectroscopy. 13th Canadian Semiconductor Technology Conference, Montréal, Canada.