Charge-pumping characterization of SOI and vertical MOS structures
(2007) 13th Canadian Semiconductor Technology Conference – CSTC’07 — Location: Montreal (Canada) (14.August.2007)
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Gluszko, G., Lukasiak, L., Szostak, S., Raskin, J.-P., Olbrechts, B., Gottlob, H., Lemme, M. C., Gili, E., Ashburn, P., Korwin-Pawlowski, M. L., & Jakubowski, A. (2007). Charge-pumping characterization of SOI and vertical MOS structures. 13th Canadian Semiconductor Technology Conference – CSTC’07, Montreal (Canada). https://hdl.handle.net/2078.5/227959