Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS

Nittler, Laurent; Delcorte, Arnaud; Bertrand, Patrick; Migeon, Henry-Noël

doi:10.1002/sia.3425

Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS

Nittler, Laurent

;

Delcorte, Arnaud

;

Bertrand, Patrick

;

Migeon, Henry-Noël

(2011) Surface and Interface Analysis — Vol. 43, n° 1-2, p. 103-106 (2011)

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Authors

Nittler, LaurentUCLouvain
Author
Delcorte, ArnaudUCLouvain
Author
Bertrand, PatrickUCLouvain
Author
Migeon, Henry-NoëlCRP Gabriel Lippmann GDL
Author

Affiliations

UCLouvainSST/IMCN/BSMA - Bio and soft matter
CRP Gabriel Lippmann GDLDépartement Science et Analyse des Matériaux (SAM)

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Nittler, L., Delcorte, A., Bertrand, P., & Migeon, H.-N. (2011). Investigating the relation between the secondary yield enhancement and the structure of the metallic overlayer in metal-assisted SIMS. Surface and Interface Analysis, 43(1-2), 103-106. https://doi.org/10.1002/sia.3425 (Original work published 2011)