On-wafer and free space characterization of materials and devices for mm-wave imaging
(2009) Workshp on Millimeter Wave Imaging and Technologies for Security Applications, KUL — Location: Leuven, Belgium (9.July.2009)
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- On-wafer and free space characterization of materials and devices for mm-wave imaging
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Roda Neve, C., Spiegel, J., Molenberg, I., Huynen, I., Elhawil, A., Poesen, G., Zhang, L., Stiens, J., Vounckx, R., & Raskin, J.-P. (2009). On-wafer and free space characterization of materials and devices for mm-wave imaging. Workshp on Millimeter Wave Imaging and Technologies for Security Applications, KUL, Leuven, Belgium. https://hdl.handle.net/2078.5/231160