Relevant modelling & Comparison of geometric distorsions in watermarking systems
(2002) SPIE 47th Annual Meeting - Optical Science and Technology — Location: Seattle, USA (1.July.2002)
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Delannay, D., Setyawan, I., Lagendijk, R. 1., & Macq, B. (2002). Relevant modelling & Comparison of geometric distorsions in watermarking systems. SPIE 47th Annual Meeting - Optical Science and Technology, Seattle, USA. https://hdl.handle.net/2078.5/224753