Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI
(2021) 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) — Location: Hsinchu, Taiwan (19.April.2021)
Files
Back-Gate_Network_Extraction_Free_from_Dynamic_Self-Heating_in_FD_SOI.pdf
Open Access - Adobe PDF
- 5.34 MB
Details
- Authors
- Affiliations
Citations
Nyssens, L., Rack, M., Halder, A., Vanbrabant, M., Kilchytska, V., & Raskin, J.-P. (2021). Back-Gate Network Extraction Free from Dynamic Self-Heating in FD SOI. IEEE International Symposium on V L S I Technology. Proceedings of Technical Papers, 1-2. https://doi.org/10.1109/vlsi-tsa51926.2021.9440125 (Original work published 2021)