Angular and energy dependences of the scattered ion yield in low-energy /sup 4/He/sup +/-Bi scattering

Delannay, Francis;Bertrand, Patrick;Streydio, Jean-Marie
(1977) Physical Review. B, Solid State — Vol. 16, n° 9, p. 3903-3907 (1977)

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Authors
  • Delannay, Francisorcid-logoUCLouvain
    Author
  • Bertrand, PatrickUCLouvain
    Author
  • Streydio, Jean-MarieUCLouvain
    Author
Abstract
Measurements are reported for the variation of scattering yields with incident energy and scattering angle for He/sup +/ ions incident on Bi surfaces and are interpreted in terms of a combination of a short-range quasiresonant and a long-range Auger type neutralization process.
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Delannay, F., Bertrand, P., & Streydio, J.-M. (1977). Angular and energy dependences of the scattered ion yield in low-energy /sup 4/He/sup +/-Bi scattering. Physical Review. B, Solid State, 16(9), 3903-3907. https://hdl.handle.net/2078.5/149166 (Original work published 1977)