Finite element method simulations of MEMS bilayersIker, F.;Du Bois, B.;De Moor, P.;Raskin, Jean-Pierre(2003) Union Radio-Scientifique Internationale (U.R.S.I.) — Location: Palaisdes Académies, Brussels (Belgium) (18.December.2003)
FilesURSI2003_iker1.pdf Open Access Adobe PDF176.42 KBDownloadDetailsAuthorsIker, F.AuthorDu Bois, B.AuthorDe Moor, P.AuthorRaskin, Jean-PierreUCLouvainAuthorAffiliationsUCLouvainSST/ICTM/ELEN - Pôle en ingénierie électriqueShow moreCitations APA Chicago FWB Iker, F., Du Bois, B., De Moor, P., & Raskin, J.-P. (2003). Finite element method simulations of MEMS bilayers. Belgian Journal of Electronics and Communications, 44-45. https://hdl.handle.net/2078.5/228613