Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS

Delcorte, Arnaud;Bertrand, Patrick;Wischerhoff, Erik;Laschewsky, André
(1998) ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems — p. 65-76, published

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  • Delcorte, ArnaudUCLouvain
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  • Bertrand, PatrickUCLouvain
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  • Wischerhoff, ErikUCLouvain
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  • Laschewsky, AndréUCLouvain
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Delcorte, A., Bertrand, P., Wischerhoff, E., & Laschewsky, A. (1998). Characterization of alternate polyelectrolyte thin films by ToF-SIMS and XPS. In J.-J. Pireaux, J. Delhalle and P. Rudolf (ed.), ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems (p. p. 65-76). Presses Universitaires de Namur. https://hdl.handle.net/2078.5/44004