Use of X-ray photoelectron spectroscopy and atomic force microscopy for studying interfaces in biofilms

Rouxhet, Paul;Dupont, Christine;Genet, Michel;Dufrêne, Yves
(2003) Biofilms in Medecine, Industry and Environmental Biotechnology — Ch. 16, p. 259-284, published

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Rouxhet, P., Dupont, C., Genet, M., & Dufrêne, Y. (2003). Use of X-ray photoelectron spectroscopy and atomic force microscopy for studying interfaces in biofilms. In Lens, P., Moran, A.P., Mahony, T., Stoodley, P. and O’Flaherty, V. (ed.), Biofilms in Medecine, Industry and Environmental Biotechnology (p. Ch. 16, p. 259-284). IWA Publishing,. https://hdl.handle.net/2078.5/154845