Fundamental aspects of organic SIMS

Delcorte, Arnaud
(2001) ToF-SIMS: Surface Analysis by Mass Spectrometry — ISBN: [1901019039], p. 161-194, published

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Delcorte, A. (2001). Fundamental aspects of organic SIMS. In J.C. Vickerman, D. Briggs (ed.), ToF-SIMS: Surface Analysis by Mass Spectrometry (p. p. 161-194). SurfaceSpectra Ltd/IM Publications. https://hdl.handle.net/2078.5/83870