Assessment of 65nm subthreshold logic for smart RFID applications
(2009) 8e Journées Faible Tension Faible Consommation (FTFC 2009) — Location: Neufchâtel (Suisse) (2.June.2009)
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- Authors
Legat, Jean-Didier 
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Hocquet, C., Bol, D., Kamel, D., & Legat, J.-D. (2009). Assessment of 65nm subthreshold logic for smart RFID applications. 8e Journées Faible Tension Faible Consommation (FTFC 2009), Neufchâtel (Suisse). https://hdl.handle.net/2078.5/253397