In-situ monitoring of the growth stress evolution during galvanostatic anodising of aluminium thin films
(2008) 213th Meeting of the Electrochemical Society — Location: Phoenix (2008)
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Van Overmeere, Q., Vanhumbeeck, J.-F., & Proost, J. (2008). In-situ monitoring of the growth stress evolution during galvanostatic anodising of aluminium thin films. Proceedings, p. #594. https://hdl.handle.net/2078.5/229960