Near-field imaging with metamaterial: deconvolution of an image using SVD

Tihon, Denis;Ozdemir, Nilufer Aslihan;Craeye, Christophe
(2013) Metamaterial’s — Location: Bordeaux (16.September.2013)

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Abstract
A deconvolution procedure based on the Array Scanning Method and the Singular Value Decomposition is presented to capture a source distribution from an image affected by white noise. The image is obtained using a collimating metamaterial made of infinite, doubly periodic array of silver nanorods with the help of the Array Scanning Method. The numerical results show that the source distribution can be captured from the image by tuning the threshold in SVD used for inversion, hence by selecting a proper source subspace.
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Tihon, D., Ozdemir, N. A., & Craeye, C. (2013). Near-field imaging with metamaterial: deconvolution of an image using SVD. Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2013 International Congress on, p. 448-450. https://doi.org/10.1109/MetaMaterials.2013.6809082