Bias-temperature phenomena in SOI structures and devices
(2000) Perspectives, Science and Technologies for Novel Silicon on Insulator Devices — ISBN: [0-7923-6116-4], p. 163-178, published
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Nazarov, A., Barchuk, I. P., & Kilchytska, V. (2000). Bias-temperature phenomena in SOI structures and devices. In éd. par P.L.F. Hemment ; V.S. Lysenko ; A.N. Nazarov. (ed.), Perspectives, Science and Technologies for Novel Silicon on Insulator Devices (p. p. 163-178). https://hdl.handle.net/2078.5/253029