Buried PN junctions impact on the performances of an inductor at RF frequencies

Fache, T.;Moulin, Maxime;Charlet, I.;Chalupa, Z.;Hutin, L.;et.al.
(2023) IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF 2023 — Location: Las Vegas, Nevada, USA (22.January.2023)

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  • Fache, T.
    Author
  • Moulin, MaximeUCLouvain
    Author
  • Charlet, I.
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  • Chalupa, Z.
    Author
  • Author
  • Hutin, L.
    Author
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Fache, T., Moulin, M., Charlet, I., Chalupa, Z., Raskin, J.-P., Allibert, F., Plantier, C., Gaillard, F., & Hutin, L. (2023). Buried PN junctions impact on the performances of an inductor at RF frequencies. IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems – SiRF 2023, Las Vegas, Nevada, USA. https://hdl.handle.net/2078.5/164297