Electronic Semiconductor Characterization Tool (ESC): From measured DC and RF parameters to a wideband electrical equivalent circuit

Emam, Mostafa;Roda Neve, Cesar;Vanhoenacker-Janvier, Danielle;Raskin, Jean-Pierre
(2009) MOS-AK/ESSDERC/ESSCIRC Workshop - MOS Modeling and Parameter Extraction Working Group — Location: Athens, Greece (18.September.2009)

Files

No attached file found for this publication.

Details

Authors
Affiliations

Citations

  • APA
  • Chicago
  • FWB

Emam, M., Roda Neve, C., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). Electronic Semiconductor Characterization Tool (ESC): From measured DC and RF parameters to a wideband electrical equivalent circuit. Proceedings of the MOS-AK/ESSDERC/ESSCIRC Workshop - MOS Modeling and Parameter Extraction Working Group, p. Paper C. https://hdl.handle.net/2078.5/231155