Direct Measurements of Anisotropic Thermal Transport in γ-InSe Nanolayers via Cross-Sectional Scanning Thermal Microscopy

Gonzalez-Munoz, S.;Agarwal, K.;Castanon, E.G.;Kudrynskyi, Z.R.;Kolosov, O.V.;et.al.
(2023) Advanced Materials Interfaces — Vol. 10, n° 17, p. 2300081 (2023)

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Authors
  • Gonzalez-Munoz, S.
    Author
  • Agarwal, K.
    Author
  • Castanon, E.G.
    Author
  • Kudrynskyi, Z.R.
    Author
  • Spiece, Jeanorcid-logoUCLouvain
    Author
  • Kolosov, O.V.
    Author
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Abstract
Van der Waals (vdW) atomically thin materials and their heterostructures offer a versatile platform for the management of nanoscale heat transport and the design of novel thermoelectrics. These require the measurement of highly anisotropic heat transport in vdW-based nanolayers, a major challenge for nanostructured materials and devices. In the present study, a novel effective method of cross-sectional scanning thermal microscopy was used to map and quantify the anisotropic heat transport in nanoscale thick layers of vdW materials and the material-substrate interfaces. This technique measures the heat conducted into a vdW crystal via the nanoscale apex of a heat-sensitive probe. The crystal is nano-polished via Ar ion beams generating an oblique nearly atomically flat surface. By measuring the thermal conductance variation as a function of increasing layer thickness, the transition between the cross-plane and in-plane heat transport (defined by heat conductivity anisotropy) is acquired. By using an analytical model validated by finite element simulations, anisotropic thermal transport in a gamma indium selenide crystal nano-thin flake on a Si substrate was studied, obtaining results corresponding to anomalously low anisotropic thermal conductivities of kxy = 2.16 Wm−1 K−1 in-plane and kz = 0.89 Wm−1 K−1 cross-plane confirming its potential for thermoelectric applications. © 2023 The Authors. Advanced Materials Interfaces published by Wiley-VCH GmbH.
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Citations

Gonzalez-Munoz, S., Agarwal, K., Castanon, E. G., Kudrynskyi, Z. R., Kovalyuk, Z. D., Spiece, J., Kazakova, O., Patanè, A., & Kolosov, O. V. (2023). Direct Measurements of Anisotropic Thermal Transport in γ-InSe Nanolayers via Cross-Sectional Scanning Thermal Microscopy. Advanced Materials Interfaces, 10(17), 2300081. https://doi.org/10.1002/admi.202300081 (Original work published 2023)