On-wafer wideband electrical characterization : a powerful tool for improving the IC technologies
(2007) Journal of Telecommunications and Information Technology — n° 2, p. 69-77 (2007)
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Lederer, D., & Raskin, J.-P. (2007). On-wafer wideband electrical characterization : a powerful tool for improving the IC technologies. Journal of Telecommunications and Information Technology, 2, 69-77. https://hdl.handle.net/2078.5/211365 (Original work published 2007)