Mechanical properties characterization of freestanding palladium films by on-chip internal stress controlled nanomechanical tensile testing
(2010) Nanobrucken Nanomechanical testing Workshop, INM — Location: Saarbrucken - Germany
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Colla, M.-S., Coulombier, M., Boé, A., Idrissi, H., Wang, B., Schrijvers, D., Proost, J., Raskin, J.-P., & Pardoen, T. (2010). Mechanical properties characterization of freestanding palladium films by on-chip internal stress controlled nanomechanical tensile testing. Proceedings of the Nanomechanical Testing Workshop and Hysitron User Meeting, 29-30. https://hdl.handle.net/2078.5/236832