[Study by electron diffraction of the structure of tantalum nitride Ta/sub 3/N/sub 5/]
(1977) Academie des Sciences. Comptes Rendus Hebdomadaires des Seances. Series A-B: Sciences Mathematiques — Vol. 285, n° 1, p. 17-20 (1977)
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- Abstract
- The structure analysis of the Ta/sub 3/N/sub 5/ crystal is carried out from electron diffraction patterns of polycrystalline thin films. By examination of the diffracted intensity of Debye-Sherrer rings, obtained by microphotometry, it is concluded that the crystalline structure of Ta/sub 3/N/sub 5/ is isomorphous with that of the high temperature form of Ti/sub 3/O/sub 5/.
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Terao, N. (1977). [Study by electron diffraction of the structure of tantalum nitride Ta/sub 3/N/sub 5/]. Academie des Sciences. Comptes Rendus Hebdomadaires des Seances. Series A-B: Sciences Mathematiques, 285(1), 17-20. https://hdl.handle.net/2078.5/85965 (Original work published 1977)