High Temperature Characterization of a Low Power HT SOI 80C51
(2006) HITEN 2006, International Conference on High Temperature ElectronicS — Location: Santa Fe (USA) (15.May.2006)
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- Authors
Legat, Jean-Didier 
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Citations
Manet, P., Bol, D., Ambroise, R., Baltus, M., Crêteur, J., Demeûs, L., & Legat, J.-D. (2006). High Temperature Characterization of a Low Power HT SOI 80C51. HITEN 2006, International Conference on High Temperature ElectronicS, Santa Fe (USA). https://hdl.handle.net/2078.5/252830