End Group Characterization of Polysterene by Time-of Flight Secondary Ion Mass Spectrometry

Vanden Eynde, Xavier;Poleunis, Claude;Bertrand, Patrick;Fallais, Isabelle;Devaux, Jacques
(1998) ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems — p. 473-484

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  • Vanden Eynde, XavierUCLouvain
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  • Bertrand, PatrickUCLouvain
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  • Fallais, IsabelleUCLouvain
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  • Devaux, JacquesUCLouvain
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Vanden Eynde, X., Poleunis, C., Bertrand, P., Fallais, I., & Devaux, J. (1998). End Group Characterization of Polysterene by Time-of Flight Secondary Ion Mass Spectrometry. In J.-J. Pireaux, J. Delhalle and P. Rudolf (ed.), ICPSI - 2, Polymer-Solid Interfaces : From Model to Real Systems (p. p. 473-484). Presses Universitaires de Namur. https://hdl.handle.net/2078.5/45114