MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric
(2008) ECS Transactions — Vol. 13, n° 2, p. 83-90 (2008)
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Charavel, R., Ackaert, J., Dhondt, K., Vlachakis, B., De Schepper, L., Millecam, M., Vandevelde, E., Bogaerts, P., De Backer, E., Ilin, A., Vlad, A., & Raskin, J.-P. (2008). MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric. ECS Transactions, 13(2), 83-90. https://hdl.handle.net/2078.5/211314 (Original work published 2008)