Joint Studies By X-ray Photoelectron-spectroscopy and Analytical Electron-microscopy of the Dispersion of Nickel-oxide Supported On Silica and Silica-aluminas

Houalla, M.;Delannay, Francis;Delmon, Bernard
(1980) Journal of the Chemical Society. Faraday Transactions I — Vol. 76, p. 1766-& (1980)

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  • Houalla, M.
    Author
  • Delannay, Francisorcid-logoUCLouvain
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  • Delmon, BernardUCLouvain
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Houalla, M., Delannay, F., & Delmon, B. (1980). Joint Studies By X-ray Photoelectron-spectroscopy and Analytical Electron-microscopy of the Dispersion of Nickel-oxide Supported On Silica and Silica-aluminas. Journal of the Chemical Society. Faraday Transactions I, 76, 1766-&. https://doi.org/10.1039/f19807601766 (Original work published 1980)