Joint Studies By X-ray Photoelectron-spectroscopy and Analytical Electron-microscopy of the Dispersion of Nickel-oxide Supported On Silica and Silica-aluminas
Houalla, M.;Delannay, Francis;Delmon, Bernard
(1980) Journal of the Chemical Society. Faraday Transactions I — Vol. 76, p. 1766-& (1980)
Houalla, M., Delannay, F., & Delmon, B. (1980). Joint Studies By X-ray Photoelectron-spectroscopy and Analytical Electron-microscopy of the Dispersion of Nickel-oxide Supported On Silica and Silica-aluminas. Journal of the Chemical Society. Faraday Transactions I, 76, 1766-&. https://doi.org/10.1039/f19807601766 (Original work published 1980)