Atomic force microscopy provides a new means for looking at microbial cells.Dufrêne, Yves(2003) ASM News (Washington) — Vol. 69, p. 438-442 (2003)
Files2003-Dufrene-ASMNews69.pdf Restricted Access Adobe PDF968.53 KBRequest a copyDetailsAuthorsDufrêne, YvesUCLouvainAuthorAffiliationsUCLouvainAGRO/CABI - Département de chimie appliquée et des bio-industriesShow moreCitations APA Chicago FWB Dufrêne, Y. (2003). Atomic force microscopy provides a new means for looking at microbial cells. ASM News (Washington), 69, 438-442. https://hdl.handle.net/2078.5/45788 (Original work published 2003)