Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

Schryvers, D.; Salje, E.K.H.; Nishida, M.; De Backer, A.; Idrissi, Hosni; Van Aert, S.

doi:10.1016/j.ultramic.2016.12.022

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

Schryvers, D.

;

Salje, E.K.H.

;

Nishida, M.

;

De Backer, A.

;

Van Aert, S.

;et.al.

(2017) Ultramicroscopy — Vol. 176, p. 194-199 (2017)

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Authors

Schryvers, D.University of Antwerp, Belgium
Author
Salje, E.K.H.University of Cambridge, UK
Author
Nishida, M.Kyushu University, Japan
Author
De Backer, A.University of Antwerp, Belgium
Author
Idrissi, HosniUCLouvain
Author
Van Aert, S.University of Antwerp, Belgium
Author

Abstract

The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

Affiliations

University of AntwerpEMAT
University of CambridgeDepartment of Earth Sciences
Kyushu UniversityFaculty of Engineering Sciences
UCLouvainSST/IMMC/IMAP - Materials and process engineering

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Schryvers, D., Salje, E. K. H., Nishida, M., De Backer, A., Idrissi, H., & Van Aert, S. (2017). Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations. Ultramicroscopy, 176, 194-199. https://doi.org/10.1016/j.ultramic.2016.12.022 (Original work published 2017)