Accurate complex permittivity measurement of a microwave low loss dielectric combining waveguide reflection and transmission on a rectangular structure

Eugène, Christian
(1975) 1975 Dielectric Materials, Measurements and Applications — Location: Cambridge, UK (21.July.1975)

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  • Eugène, ChristianUCLouvain
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Abstract
The metrological use of a slab-loaded rectangular guide driven at a frequency corresponding to an integral number of half wavelengths in the sample is discussed. A simple swept reflectometer technique leads to the determination of the permittivity with an uncertainty of a few promille at X band. A similar technique is combined with a transmission method to determine low losses. An accuracy of a few tens of microradians has been achieved for loss angle.
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Eugène, C. (1975). Accurate complex permittivity measurement of a microwave low loss dielectric combining waveguide reflection and transmission on a rectangular structure. 1975 Dielectric Materials, Measurements and Applications, p. 173-177. https://hdl.handle.net/2078.5/223317