Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers
(2022) Nanomaterials — Vol. 12, n° 2, p. 265 (2022)
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EstimationoftheYoungsModulusofNanometer-ThickFilmsUsingResidualStress-DrivenBilayerCantilevers.pdf
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Velosa-Moncada, Luis A. 
López-Huerta, Francisco Herrera-May, Agustín L.
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Velosa-Moncada, L. A., Raskin, J.-P., Aguilera-Cortés, L. A., López-Huerta, F., & Herrera-May, A. L. (2022). Estimation of the Young’s Modulus of Nanometer-Thick Films Using Residual Stress-Driven Bilayer Cantilevers. Nanomaterials, 12(2), 265. https://doi.org/10.3390/nano12020265 (Original work published 2022)