Scanning probe microscopy study of the electronic properties in alkyl-substituted oligothiophene-based organic field-effect transistors
(2010) 18th International Vacuum Congress - IVC18 — Location: Beijing, China (23.August.2010)
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Afsharimani, N. S., & Nysten, B. (2010). Scanning probe microscopy study of the electronic properties in alkyl-substituted oligothiophene-based organic field-effect transistors. 18th International Vacuum Congress - IVC18, Beijing, China. https://hdl.handle.net/2078.5/226355