Core-level shifts in Si(001)-SiO2 systems: The value of first-principle investigations
(1998) Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices — ISBN: [0792350073], p. pp 89-102, published
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Pasquarello, A., Hybertsen, M. S., Rignanese, G.-M., & Car, R. (1998). Core-level shifts in Si(001)-SiO2 systems: The value of first-principle investigations. In E. Garfunkel, E. Gusev and A. Vul (ed.), Fundamental Aspects of Ultrathin Dielectrics on Si-based Devices (p. p. pp 89-102). Kluwer. https://hdl.handle.net/2078.5/206526