Determination of Lattice-defects in Carbon-fibers By Means of Thermal-conductivity Measurements

Nysten, Bernard;Issi, Jean-Paul;Barton, R.;Boyington, D. R.;Lavin, Jerry G.
(1991) Physical Review. B, Condensed Matter — Vol. 44, n° 5, p. 2142-2148 (1991)

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  • Author
  • Issi, Jean-PaulUCLouvain
    Author
  • Barton, R.Du Pont, Wilmington, DE
    Author
  • Boyington, D. R.Du Pont, Wilmington, DE
    Author
  • Lavin, Jerry G.Du Pont, Wilmington, DE
    Author
Abstract
The temperature variation of the thermal conductivity of six samples of pitch-derived carbon fibers has been measured in the temperature range 3 < T < 300 K. The lattice thermal conductivity has been fitted, with boundary and point-defect scattering for the phonons taken into consideration. It is shown that the in-plane coherence lengths determined by x-ray diffraction are almost equal to the phonon mean free paths for boundary scattering. It is thus suggested that thermal-conductivity measurements can be used to determine quantitatively in-plane coherence lengths in the range where x-ray techniques are inadequate. The analysis also allows one to compare shear moduli (C44) and yields information on point defects.
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Citations

Nysten, B., Issi, J.-P., Barton, R., Boyington, D. R., & Lavin, J. G. (1991). Determination of Lattice-defects in Carbon-fibers By Means of Thermal-conductivity Measurements. Physical Review. B, Condensed Matter, 44(5), 2142-2148. https://doi.org/10.1103/PhysRevB.44.2142 (Original work published 1991)