Characterization of polymer surfaces by means of the ionic spectrometries : ISS and static SIMS

Bertrand, Patrick;De Puydt, Yves;Léonard, Didier;Weng, Lu Tao
(1991) Le vide, les couches minces — Vol. 256, n° suppl., p. 371-380 (1991)

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  • Bertrand, PatrickUCLouvain
    Author
  • De Puydt, YvesUCLouvain
    Author
  • Léonard, DidierUCLouvain
    Author
  • Weng, Lu TaoUCLouvain
    Author
Abstract
The recent developments in the polymer surfaces characterization by Secondary Ion Mass Spectrometry in the Static mode (SSIMS) and by Ion Scattering Spectrometry (ISS) are reviewed. The characteristic fingerprint nature of the SSIMS spectra obtained on polymers is stressed and the potentialities of SSIMS for the functional and structural analyses of polymer surfaces are demonstrated. The ability of ISS, taking advantage of its extreme surface sensitivity, to look at the molecular orientation at the surface of the polymers is commented. Some applications of these techniques to study the surface modifications produced by different treatments are presented : fluorination of polyethylene terephthalate (PET), plasma treatment of polypropylene (PP) and metal deposition on PET and PP.
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Bertrand, P., De Puydt, Y., Léonard, D., & Weng, L. T. (1991). Characterization of polymer surfaces by means of the ionic spectrometries : ISS and static SIMS. Le vide, les couches minces, 256(suppl.), 371-380. https://hdl.handle.net/2078.5/153646 (Original work published 1991)