Surface characterization of silicon nanostructures
(2010) Postgraduate Conference at Newcastle University – PGC 2010 — Location: Newcastle Upon Tyne, UK (13.January.2010)
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- Abstract
- Nanowires and thin film materials are being subject of study in recent years due to their unique electrical and mechanical properties. It has been proved through different experimental works that surface effects greatly affect properties of nanostructures. As an example, very silicon thin film samples of about 50 nm thick or thinner, present unusual higher piezoresistance values and a high dependence with Si-SiO2 interface electron trapping effect. Our aim in this project is to characterize surface properties of nanowires, thin films and other nanostructures, using macro- and nanocharacterization techniques.
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Citations
Urena, F., Olsen, S., & Raskin, J.-P. (2010). Surface characterization of silicon nanostructures. Proceedings of the Postgraduate Conference at Newcastle University – PGC 20101, p. 49. https://hdl.handle.net/2078.5/231135